- Ensure precise testing and aging of QFP64, LQFP64, and TQFP64 chips with our Burn-In Socket, designed for stability and reliability. - The socket's construction guarantees secure connections, making it essential for accurate chip tests and efficient performance during extended aging processes. - Ideal for semiconductor engineers, electronic lab technicians, and professionals requiring reliable tools for chip testing and aging. - This burn-in socket is perfect for electronics manufacturing workshops conducting batch aging tests, as well as laboratories verifying chip performance and long-term stability. Key Features: - Compatibility: Specifically designed for QFP64, LQFP64, and TQFP64 chip types, ensuring seamless integration with your existing testing setups. - Performance: Built to withstand rigorous testing environments, providing consistent results that meet industry standards. - Size: Compact design allows easy integration into various testing rigs without compromising space. Applications: - Use in semiconductor research labs to validate chip performance under prolonged stress conditions. - Implement in production lines to conduct batch aging tests, enhancing quality control processes. - Utilize in R&D settings for developing new chip technologies, ensuring reliability before market release.