Steel microprobe — key benefits and features - Durable steel construction - The microprobe is manufactured from steel for long-term durability and reliable, repeatable measurements in inspection and metrology tasks. - Lightweight, stable ball head - A precision-engineered, low-mass ball head minimizes inertia while maintaining stability. Delivers accurate, consistent probe readings even when temperatures change. - Integrated anti-collision protection - A hard-metal (carbide) rod provides built-in collision protection to absorb and resist accidental shocks, reducing downtime and protecting sensitive measurement elements. - Non-magnetic and non-conductive properties - Designed to be non-magnetic and non-conductive, making the probe suitable for use on silicon carbide (SiC) surfaces and in electrical discharge machining (EDM) environments where magnetic or conductive materials would interfere. Why you need this probe - Protects your measurements: robust materials and anti-collision design reduce the risk of damage and measurement errors from accidental impacts. - Maintains accuracy across conditions: the lightweight ball head preserves measurement consistency despite temperature fluctuations common in shop-floor and machining environments. - Expands compatibility: non-magnetic, non-conductive behaviour enables reliable use on SiC workpieces and near EDM processes where standard probes may be unsuitable. Applications / use scenarios - Inspecting silicon carbide components and wafers where non-magnetic, non-conductive contact is required to avoid interference or damage. - Precision probing on machine tools or metrology stations operating near EDM processes or in environments with electrical discharge activity. - Dimensional inspection of delicate or brittle materials where integrated collision protection helps prevent probe and part damage during automated measurement cycles. Key attributes (at a glance) - Function: precision microprobe for contact measurement - Material: steel probe body with hard-metal (carbide) protective rod and lightweight ball head - Performance: stable, repeatable measurements with collision resistance and thermal stability - Compatibility: suitable for silicon carbide surfaces and EDM environments due to non-magnetic, non-conductive characteristics This probe is designed to deliver reliable, precise contact measurements while protecting both the probe and the part in demanding machining and inspection situations.