From Contamination to Defects Faults and Yield Loss

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From Contamination to Defects Faults and Yield Loss

From Contamination to Defects Faults and Yield Loss

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From Contamination to Defects Faults and Yield Loss

  • Brand: Unbranded

$159.00

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$159.00

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+ $6.99 Shipping
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Description

From Contamination to Defects Faults and Yield Loss

1. Introduction. - 1. 1 Trends in IC Manufacturing. - 1. 2 Yield Loss Mechanisms in ICs. - 1. 3 Functional Yield Estimation. - 1. 4 Research Goals. - 1. 5 Outline. - 1. 6 References. - 2. Background. - 2. 1 Terminology. - 2. 2 Point Model. - 2. 3 Disk Model. - 2. 4 Experimental Investigation of the Disk Model. - 2. 5 Summary. - 2. 6 References. - 3. Contamination-Defect-Fault (CDF) Simulation. - 3. 1 New Contamination Model. - 3. 2 Contamination-Defect-Fault (CDF) Simulation. - 3. 3 References. - 4. CDF Mapper CODEF. - 4. 1 CODEF - An Overview. - 4. 2 Chip Data Base (CDB). - 4. 3 Process Models. - 4. 4 Circuit Extraction. - 4. 5 Netlist Comparison. - 4. 6 CODEF - Illustration. - 4. 7 Runtime and Memory Usage. - 4. 8 References. - 5. CODEF - Applications. - 5. 1 Yield Estimation. - 5. 2 Fault Modeling. - 5. 3 Failure Analysis. - 5. 4 References. - 6. Possible Extensions. - 6. 1 CODEF Speed and Memory Considerations. - 6. 2 Addition of New Process Models. - 6. 3 Additional Contamination Properties. - 6. 4 Extraction of Bipolar Transistors. - 6. 5 Identification of Contamination Parameters. - 6. 6 References. - 7. Conclusion. - Appendix A: CMOS Process Flow. Language: English
  • Brand: Unbranded
  • Category: Education
  • Artist: Jitendra B. Khare
  • Format: Paperback
  • Language: English
  • Publication Date: 2011/09/26
  • Publisher / Label: Springer
  • Number of Pages: 150
  • Fruugo ID: 337901841-741561201
  • ISBN: 9781461285953

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