Characterization of Stress in GaN-on-Sapphire Microelectromechanical Systems Structures Using Micro-Raman Spectroscopy
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Characterization of Stress in GaN-on-Sapphire Microelectromechanical Systems Structures Using Micro-Raman Spectroscopy
- Brand: Unbranded
Characterization of Stress in GaN-on-Sapphire Microelectromechanical Systems Structures Using Micro-Raman Spectroscopy
- Brand: Unbranded
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Description
Characterization of Stress in GaN-on-Sapphire Microelectromechanical Systems Structures Using Micro-Raman Spectroscopy
- Brand: Unbranded
- Category: Society & Politics
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Format: Paperback
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Language: English
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Publication Date: 2012/11/29
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Publisher / Label: Biblioscholar
- Fruugo ID: 337695428-741343199
- ISBN: 9781288368518
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