Characterization of High Tc Materials and Devices by Electron Microscopy
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Product details
Product details
Characterization of High Tc Materials and Devices by Electron Microscopy
- Brand: Unbranded
- Category: Education
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Format: Hardback
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Language: English
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Publication Date: 2000/07/06
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Publisher / Label: Cambridge University Press
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Number of Pages: 406
- Fruugo ID: 337986182-741646707
- ISBN: 9780521554909
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